Review of Scientific Instruments -- December 1993
Volume 64, Issue 12, pp. 3456-3461

A computer program to analyze x-ray diffraction films
Jeffrey H. Nguyen
Department of Physics, University of California at Berkeley, Berkeley, California 94720
Raymond Jeanloz
Geology and Geophysics, University of California at Berkeley, Berkeley, California 94720

We have developed a Macintosh computer program to analyze Debye-Scherrer x-ray powder diffraction films digitized with a conventional scanner. The program uses a fast derivatives-free procedure to fit distorted ellipses corresponding to the diffraction rings on the film. These ellipses are collapsed into a one-dimensional plot of intensity versus scattering angle, from which one can extract information about the diffraction pattern that would have been lost in visual reading. Moreover, uncertainties are decreased by a factor of ~30 over visual reading, and the analysis of diffraction films is reduced to a matter of minutes.

History Received: 10 May 1993; Accepted: 26 August 1993
Subject Structure of solids and liquids; crystallography
PACS
  • CODE: 61.10.Wg
    Structure of solids and liquids; crystallography : X-ray diffraction and scattering : [Other computational techniques]
  • YEAR: 1993
KeywordsFILMS; X-RAY DIFFRACTION; DATA ANALYSIS; COMPUTER CODES; DIGITIZERS; DEBYE-SCHERRER METHOD; SPATIAL RESOLUTION; POWDERS
Doc. TypeComputing; Method
Coden RSINAK

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